Measurement of Noise Along Electrostatically Focused Electron Beams

H. L. Hartnagel; A. Gopinath; S. On

doi:10.1109/T-ED.1968.16537

Measurement of Noise Along Electrostatically Focused Electron Beams

H. L. Hartnagel, A. Gopinath, S. On

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

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Abstract

Noise Noise along periodic-electrostatically focused electron beams have been measured. The noise variation is periodic with the wavelength of the reduced plasma frequency. It is concluded that electrostatic focusing exhibits similar noise properties as magnetic focusing.

Original language	English (US)
Pages (from-to)	936-938
Number of pages	3
Journal	IEEE Transactions on Electron Devices
Volume	15
Issue number	11
DOIs	https://doi.org/10.1109/T-ED.1968.16537
State	Published - Nov 1968

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title = "Measurement of Noise Along Electrostatically Focused Electron Beams",

abstract = "Noise Noise along periodic-electrostatically focused electron beams have been measured. The noise variation is periodic with the wavelength of the reduced plasma frequency. It is concluded that electrostatic focusing exhibits similar noise properties as magnetic focusing.",

author = "Hartnagel, {H. L.} and A. Gopinath and S. On",

year = "1968",

month = nov,

doi = "10.1109/T-ED.1968.16537",

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AU - Hartnagel, H. L.

AU - Gopinath, A.

AU - On, S.

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N2 - Noise Noise along periodic-electrostatically focused electron beams have been measured. The noise variation is periodic with the wavelength of the reduced plasma frequency. It is concluded that electrostatic focusing exhibits similar noise properties as magnetic focusing.

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JO - IEEE Transactions on Electron Devices

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Measurement of Noise Along Electrostatically Focused Electron Beams

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