Measurement Error Obfuscates Scientific Knowledge: Path to Cumulative Knowledge Requires Corrections for Unreliability and Psychometric Meta-Analyses

Chockalingam Viswesvaran; Deniz S. Ones; Frank L. Schmidt; Huy Le; In Sue Oh

doi:10.1111/iops.12186

Measurement Error Obfuscates Scientific Knowledge: Path to Cumulative Knowledge Requires Corrections for Unreliability and Psychometric Meta-Analyses

Chockalingam Viswesvaran, Deniz S. Ones, Frank L. Schmidt, Huy Le, In Sue Oh

Psychology (Twin Cities)

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Original language	English (US)
Pages (from-to)	507-518
Number of pages	12
Journal	Industrial and Organizational Psychology
Volume	7
Issue number	4
DOIs	https://doi.org/10.1111/iops.12186
State	Published - Dec 1 2014

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Measurement Error Obfuscates Scientific Knowledge: Path to Cumulative Knowledge Requires Corrections for Unreliability and Psychometric Meta-Analyses. / Viswesvaran, Chockalingam; Ones, Deniz S.; Schmidt, Frank L. et al.
In: Industrial and Organizational Psychology, Vol. 7, No. 4, 01.12.2014, p. 507-518.

Research output: Contribution to journal › Article › peer-review

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Measurement Error Obfuscates Scientific Knowledge: Path to Cumulative Knowledge Requires Corrections for Unreliability and Psychometric Meta-Analyses

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