The quality factors of microstrip half-wavelength resonators have been calculated as a function of substrate thickness, for frequencies in the range 8–96 GHz, for different ∊r. Conductor, dielectric, and radiation losses have been included. The optimum substrate thickness for the maximum Q-factor for 50–Ω microstrip resonators has been derived as a function of frequency for different dielectric constants.
|Original language||English (US)|
|Number of pages||4|
|Journal||IEEE Transactions on Microwave Theory and Techniques|
|State||Published - Feb 1981|