TY - JOUR
T1 - Maximum Q-Factor of Microstrip Resonators
AU - Gopinath, Anand
PY - 1981/2
Y1 - 1981/2
N2 - The quality factors of microstrip half-wavelength resonators have been calculated as a function of substrate thickness, for frequencies in the range 8–96 GHz, for different ∊r. Conductor, dielectric, and radiation losses have been included. The optimum substrate thickness for the maximum Q-factor for 50–Ω microstrip resonators has been derived as a function of frequency for different dielectric constants.
AB - The quality factors of microstrip half-wavelength resonators have been calculated as a function of substrate thickness, for frequencies in the range 8–96 GHz, for different ∊r. Conductor, dielectric, and radiation losses have been included. The optimum substrate thickness for the maximum Q-factor for 50–Ω microstrip resonators has been derived as a function of frequency for different dielectric constants.
UR - http://www.scopus.com/inward/record.url?scp=0019529661&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0019529661&partnerID=8YFLogxK
U2 - 10.1109/TMTT.1981.1130308
DO - 10.1109/TMTT.1981.1130308
M3 - Article
AN - SCOPUS:0019529661
SN - 0018-9480
VL - 29
SP - 128
EP - 131
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
IS - 2
ER -