Martensite transformation of epitaxial Ni-Ti films

J. Buschbeck; J. K. Kawasaki; A. Kozhanov; R. D. James; C. J. Palmstrøm

doi:10.1063/1.3589361

Martensite transformation of epitaxial Ni-Ti films

J. Buschbeck, J. K. Kawasaki, A. Kozhanov, R. D. James, C. J. Palmstrøm

Aerospace Engineering and Mechanics

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

The structure and phase transformations of thin Ni-Ti shape memory alloy films grown by molecular beam epitaxy are investigated for compositions from 43 to 56 at. % Ti. Despite the substrate constraint, temperature dependent x-ray diffraction and resistivity measurements reveal reversible, martensitic phase transformations. The results suggest that these occur by an in-plane shear which does not disturb the lattice coherence at interfaces.

Original language	English (US)
Article number	191901
Journal	Applied Physics Letters
Volume	98
Issue number	19
DOIs	https://doi.org/10.1063/1.3589361
State	Published - May 9 2011

Bibliographical note

Funding Information:
We thank J. L. Hall, R. Liptak, and L. Feigl for fruitful discussions. This work was funded by ARO-MURI Grant No. W911NF-07-1-0410. The MRL Central Facilities are supported by the MRSEC Program of the NSF; a member of the NSF-funded Materials Research Facilities Network.

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abstract = "The structure and phase transformations of thin Ni-Ti shape memory alloy films grown by molecular beam epitaxy are investigated for compositions from 43 to 56 at. % Ti. Despite the substrate constraint, temperature dependent x-ray diffraction and resistivity measurements reveal reversible, martensitic phase transformations. The results suggest that these occur by an in-plane shear which does not disturb the lattice coherence at interfaces.",

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AU - Kawasaki, J. K.

AU - Kozhanov, A.

AU - James, R. D.

AU - Palmstrøm, C. J.

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N2 - The structure and phase transformations of thin Ni-Ti shape memory alloy films grown by molecular beam epitaxy are investigated for compositions from 43 to 56 at. % Ti. Despite the substrate constraint, temperature dependent x-ray diffraction and resistivity measurements reveal reversible, martensitic phase transformations. The results suggest that these occur by an in-plane shear which does not disturb the lattice coherence at interfaces.

AB - The structure and phase transformations of thin Ni-Ti shape memory alloy films grown by molecular beam epitaxy are investigated for compositions from 43 to 56 at. % Ti. Despite the substrate constraint, temperature dependent x-ray diffraction and resistivity measurements reveal reversible, martensitic phase transformations. The results suggest that these occur by an in-plane shear which does not disturb the lattice coherence at interfaces.

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Martensite transformation of epitaxial Ni-Ti films

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