Magnetostriction measurement in thin films using laser Doppler vibrometry

Ronnie Varghese; Ravindranath Viswan; Keyur Joshi; Safoura Seifikar; Yuan Zhou; Justin Schwartz; Shashank Priya

doi:10.1016/j.jmmm.2014.03.076

Magnetostriction measurement in thin films using laser Doppler vibrometry

Ronnie Varghese, Ravindranath Viswan, Keyur Joshi, Safoura Seifikar, Yuan Zhou, Justin Schwartz, Shashank Priya

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.

Original language	English (US)
Pages (from-to)	179-187
Number of pages	9
Journal	Journal of Magnetism and Magnetic Materials
Volume	363
DOIs	https://doi.org/10.1016/j.jmmm.2014.03.076
State	Published - Aug 2014
Externally published	Yes

Bibliographical note

Funding Information:
The authors gratefully acknowledge the financial support from Air Force Office of Scientific Research ( AFOSR ) through Young Investigator Program and CERDEC . We would like to thank Greg Pribil of J.A. Woollam Inc. for help with modeling of the thin film VASE data. We are also greatly indebted to our CEHMS colleagues Justin Farmer and SuChul Yang for assistance with the experimental setup.

Keywords

Doppler effect
Laser vibrometry
Magnetic thin film
Magnetostriction
Microstrain

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10.1016/j.jmmm.2014.03.076

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title = "Magnetostriction measurement in thin films using laser Doppler vibrometry",

abstract = "This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.",

keywords = "Doppler effect, Laser vibrometry, Magnetic thin film, Magnetostriction, Microstrain",

author = "Ronnie Varghese and Ravindranath Viswan and Keyur Joshi and Safoura Seifikar and Yuan Zhou and Justin Schwartz and Shashank Priya",

note = "Funding Information: The authors gratefully acknowledge the financial support from Air Force Office of Scientific Research ( AFOSR ) through Young Investigator Program and CERDEC . We would like to thank Greg Pribil of J.A. Woollam Inc. for help with modeling of the thin film VASE data. We are also greatly indebted to our CEHMS colleagues Justin Farmer and SuChul Yang for assistance with the experimental setup. ",

year = "2014",

month = aug,

doi = "10.1016/j.jmmm.2014.03.076",

language = "English (US)",

volume = "363",

pages = "179--187",

journal = "Journal of Magnetism and Magnetic Materials",

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TY - JOUR

T1 - Magnetostriction measurement in thin films using laser Doppler vibrometry

AU - Varghese, Ronnie

AU - Viswan, Ravindranath

AU - Joshi, Keyur

AU - Seifikar, Safoura

AU - Zhou, Yuan

AU - Schwartz, Justin

AU - Priya, Shashank

N1 - Funding Information: The authors gratefully acknowledge the financial support from Air Force Office of Scientific Research ( AFOSR ) through Young Investigator Program and CERDEC . We would like to thank Greg Pribil of J.A. Woollam Inc. for help with modeling of the thin film VASE data. We are also greatly indebted to our CEHMS colleagues Justin Farmer and SuChul Yang for assistance with the experimental setup.

PY - 2014/8

Y1 - 2014/8

N2 - This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.

AB - This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.

KW - Doppler effect

KW - Laser vibrometry

KW - Magnetic thin film

KW - Magnetostriction

KW - Microstrain

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SN - 0304-8853

VL - 363

SP - 179

EP - 187

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

ER -

Magnetostriction measurement in thin films using laser Doppler vibrometry

Abstract

Bibliographical note

Keywords

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