Magnetostriction measurement in thin films using laser Doppler vibrometry

Ronnie Varghese, Ravindranath Viswan, Keyur Joshi, Safoura Seifikar, Yuan Zhou, Justin Schwartz, Shashank Priya

Research output: Contribution to journalArticlepeer-review

19 Scopus citations


This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.

Original languageEnglish (US)
Pages (from-to)179-187
Number of pages9
JournalJournal of Magnetism and Magnetic Materials
StatePublished - Aug 2014
Externally publishedYes

Bibliographical note

Funding Information:
The authors gratefully acknowledge the financial support from Air Force Office of Scientific Research ( AFOSR ) through Young Investigator Program and CERDEC . We would like to thank Greg Pribil of J.A. Woollam Inc. for help with modeling of the thin film VASE data. We are also greatly indebted to our CEHMS colleagues Justin Farmer and SuChul Yang for assistance with the experimental setup.


  • Doppler effect
  • Laser vibrometry
  • Magnetic thin film
  • Magnetostriction
  • Microstrain


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