Magnetic response versus lift height of thin ferromagnetic films

Tanner Schulz, Gabe Burch, Andrew Kunz, E. Dan Dahlberg

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The interaction between a magnetic force microscope (MFM) tip and ferromagnetic films of Ni, Co90 Fe10 and Py with in-plane magnetization has been investigated. The measured interaction, due to the magnetizing of the films by the MFM tip field, was determined by the phase shift of the cantilever response. The tip-film separation or lift height dependent phase shift was found to be independent of the saturation magnetization of the ferromagnetic film. The result is identical for all three films and micromagnetic simulations give similar results. The reason is at a given tip-sample separation the tip induced magnetization of the film creates a demagnetization field which is equal in magnitude to the tip field at that separation.

Original languageEnglish (US)
Article number5467511
Pages (from-to)1752-1754
Number of pages3
JournalIEEE Transactions on Magnetics
Volume46
Issue number6
DOIs
StatePublished - Jun 2010

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported by the MRSEC Program of the National Science Foundation under Award Number DMR-0819885.

Keywords

  • Magnetic films
  • Magnetic force microscopy

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