Keyphrases
X-ray Photoelectron Spectroscopy
100%
Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS)
100%
Macromolecular Surface
100%
Photopatterning
100%
Nitrile Oxide
100%
Surface Design
100%
Shelf-stable
50%
Surface Modification
50%
Electrospray Ionization Mass Spectrometry
50%
End-functionalization
50%
Micropatterning
50%
Polymer Brushes
50%
Surface Functionalization
50%
Functional Surface
50%
Spatial Control
50%
Ellipsometry
50%
1,3-dipolar Cycloaddition
50%
Shadow Mask
50%
Surface-initiated Atom Transfer Radical Polymerization (SI-ATRP)
50%
Polymer Chain Ends
50%
Modular Ligation
50%
Thioaldehydes
50%
Photo-generated
50%
Spatially Confined
50%
Material Science
Secondary Ion Mass Spectrometry
100%
X-Ray Photoelectron Spectroscopy
100%
Surface (Surface Science)
100%
Surface Design
100%
Oxide Compound
100%
Atom-Transfer Radical-Polymerization
50%
Surface Functionalization
50%
Polymer Brush
50%
Electrospray Ionization
50%
Surface Treatment
50%
Chemical Engineering
Secondary Ion Mass Spectrometry
100%
Electrosprays
50%
Mass Spectrometry
50%
Atom-Transfer Radical-Polymerization
50%
Ellipsometry
50%