Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope

Sheryl Foss, Roger Proksch, E. Dan Dahlberg, Bruce Moskowitz, Brian Walsh

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip-sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.

Original languageEnglish (US)
Pages (from-to)3426-3428
Number of pages3
JournalApplied Physics Letters
Volume69
Issue number22
DOIs
StatePublished - Nov 25 1996

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