Abstract
Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip-sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.
Original language | English (US) |
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Pages (from-to) | 3426-3428 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 69 |
Issue number | 22 |
DOIs | |
State | Published - Nov 25 1996 |