Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope

Sheryl Foss; Roger Proksch; E. Dan Dahlberg; Bruce Moskowitz; Brian Walsh

doi:10.1063/1.117281

Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope

Sheryl Foss, Roger Proksch, E. Dan Dahlberg, Bruce Moskowitz, Brian Walsh

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42 Scopus citations

Abstract

Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip-sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.

Original language	English (US)
Pages (from-to)	3426-3428
Number of pages	3
Journal	Applied Physics Letters
Volume	69
Issue number	22
DOIs	https://doi.org/10.1063/1.117281
State	Published - Nov 25 1996

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abstract = "Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip-sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.",

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AU - Proksch, Roger

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AU - Moskowitz, Bruce

AU - Walsh, Brian

PY - 1996/11/25

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N2 - Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip-sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.

AB - Magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip-sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.

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Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope

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