Localized magnetic reversal of a perpendicular anisotropy thin film has been performed using the magnetostrictive response of the film to a force applied by probe tips of scanning force microscope cantilevers. Non-magnetic and magnetic cantilever tips were used to apply local stresses which alter the local magnetization through magnetostriction. The magnetic field of the tip, if any, and the local demagnetizing field of the film reverse the stressed area for stresses exceeding a critical value. These findings were in agreement with a simple model.
|Original language||English (US)|
|Number of pages||6|
|Journal||Journal of Magnetism and Magnetic Materials|
|State||Published - Dec 1 1998|
Bibliographical noteFunding Information:
The authors gratefully acknowledge William Challener for preparation of the thin film samples used for this work. This work was supported by Imation Corporation and grants #N00014-94-1-0123 and #N00014-95-1-0799 from the Office of Naval Research. One of the authors (J.S.) would like to thank the University of Minnesota graduate school for financial support.
- Anisotropy constant
- Magnetization reversal