Local ultra-densification of single-walled carbon nanotube films: Experiment and mesoscopic modeling

Artem K. Grebenko, Grigorii Drozdov, Yuriy G. Gladush, Igor Ostanin, Sergey S. Zhukov, Aleksandr V. Melentyev, Eldar M. Khabushev, Alexey P. Tsapenko, Dmitry V. Krasnikov, Boris Afinogenov, Alexei G. Temiryazev, Viacheslav V. Dremov, Traian Dumitricã, Mengjun Li, Hussein Hijazi, Vitaly Podzorov, Leonard C. Feldman, Albert G. Nasibulin

Research output: Contribution to journalArticlepeer-review

Abstract

Fabrication of nanostructured metasurfaces poses a significant technological and fundamental challenge. Despite developing novel material systems that support reversible elongation and distortion, their nanoscale patterning and control of optical properties remain an open problem. Herein we report the atomic force microscope lithography application for nanoscale patterning of single-walled carbon nanotube films and the associated optical reflection coefficient tuning. Large scale mesoscopic distinct element method atomic force nanoindentation simulations of single-walled carbon nanotube samples comprising entangled dendritic nanotube bundles with branches extending down to individual tubes explain the mesoscale mechanism of local irreversible densification and further predict its impact on mechanical properties. All observed and calculated phenomena support each other and present a platform for developing patterned optical devices using nanofibrous matter.

Original languageEnglish (US)
Pages (from-to)979-987
Number of pages9
JournalCarbon
Volume196
DOIs
StatePublished - Aug 30 2022

Bibliographical note

Funding Information:
Authors are grateful to Ms. Anastasiia Grebenko for assistance with sample preparation and Mr. Andrey Starkov for graphical illustrations and engineering assistance. Authors also thank Mr. Anton Bubis for the help with SEM images, prof. Sergey Zaitsev and Dr. Alexandr Svintsov for calculating the computer-generated hologram. A.K.G. and A.G.N acknowledge support from RFBR grant 19-32-90143 . E.M.Kh. and D.V.K. acknowledge Russian Science Foundation grant No. 20-73-10256 (synthesis of SWCNTs and optical measurements). Y.G.G. acknowledge support from RFBR grant 18-29-20032 . The Authors acknowledge the use of computational resources of the Skoltech CDISE supercomputer Zhores [ 61 ]. G.D. work was supported by the UMN Grant-in-Aid Program. I.O. acknowledges support from RFBR grant 18-29-19198 . A.P.Ts. acknowledges the EDUFI Fellowship (No. TM-19-11079 ) from the Finnish National Agency for Education and the Magnus Ehrnrooth Foundation (the Finnish Society of Sciences and Letters) for personal financial support. This work is supported by the Council on grants of the President of the Russian Federation grant number НШ-1330.2022.1.3. T.D. acknowledges support from the U.S. Fulbright Scholar in Russia Program.

Publisher Copyright:
© 2022 Elsevier Ltd

Keywords

  • AFM lithography
  • MDEM
  • Metasurface
  • SWCNT films

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