Leveraging Process Fundamentals to Improve Semiconductor Thickness Control and Uniformity in Inkjet-Printed Schottky Diodes

Jonathan D. Nguyen, Satish Kumar, C. Daniel Frisbie, Lorraine F. Francis

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)693-705
JournalACS Applied Engineering Materials
Volume2
Issue number3
DOIs
StatePublished - Mar 22 2024

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