Abstract
Kohonen maps have been successfully applied for data reduction and density approximation. Unfortunately, the choice of the neighborhood function and the learning rate in the Kohonen model remains empirical. We present a new statistically motivated approach to determine the contribution of each data presentation during training on the final position of the units of the trained map. Experimental results show that employing the commonly used learning rates leads to unit locations which are overly influenced by the later presentations (i.e., last 20% of data points in the finite training set). Better learning rate schedules and neighborhood functions are men determined which allow more uniform contributions of the training data on the unit locations. These improved rates are shown to be a suitable generalization of the standard rates given by stochastic approximation theory for a self-organizing map of units.
Original language | English (US) |
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Title of host publication | Proceedings of the 12th IAPR International Conference on Pattern Recognition - Conference B |
Subtitle of host publication | Pattern Recognition and Neural Networks, ICPR 1994 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 224-228 |
Number of pages | 5 |
ISBN (Electronic) | 0818662700 |
State | Published - 1994 |
Event | 12th IAPR International Conference on Pattern Recognition - Conference B: Pattern Recognition and Neural Networks, ICPR 1994 - Jerusalem, Israel Duration: Oct 9 1994 → Oct 13 1994 |
Publication series
Name | Proceedings - International Conference on Pattern Recognition |
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Volume | 2 |
ISSN (Print) | 1051-4651 |
Conference
Conference | 12th IAPR International Conference on Pattern Recognition - Conference B: Pattern Recognition and Neural Networks, ICPR 1994 |
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Country/Territory | Israel |
City | Jerusalem |
Period | 10/9/94 → 10/13/94 |
Bibliographical note
Funding Information:Acknowledgement: This work was supported, in part, by 3M corporation.
Publisher Copyright:
© 1994 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.