Learning rate schedules for self-organizing maps

Filip Mulier, Vladimir Cherkassky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

Kohonen maps have been successfully applied for data reduction and density approximation. Unfortunately, the choice of the neighborhood function and the learning rate in the Kohonen model remains empirical. We present a new statistically motivated approach to determine the contribution of each data presentation during training on the final position of the units of the trained map. Experimental results show that employing the commonly used learning rates leads to unit locations which are overly influenced by the later presentations (i.e., last 20% of data points in the finite training set). Better learning rate schedules and neighborhood functions are men determined which allow more uniform contributions of the training data on the unit locations. These improved rates are shown to be a suitable generalization of the standard rates given by stochastic approximation theory for a self-organizing map of units.

Original languageEnglish (US)
Title of host publicationProceedings of the 12th IAPR International Conference on Pattern Recognition - Conference B
Subtitle of host publicationPattern Recognition and Neural Networks, ICPR 1994
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages224-228
Number of pages5
ISBN (Electronic)0818662700
StatePublished - 1994
Event12th IAPR International Conference on Pattern Recognition - Conference B: Pattern Recognition and Neural Networks, ICPR 1994 - Jerusalem, Israel
Duration: Oct 9 1994Oct 13 1994

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume2
ISSN (Print)1051-4651

Conference

Conference12th IAPR International Conference on Pattern Recognition - Conference B: Pattern Recognition and Neural Networks, ICPR 1994
Country/TerritoryIsrael
CityJerusalem
Period10/9/9410/13/94

Bibliographical note

Funding Information:
Acknowledgement: This work was supported, in part, by 3M corporation.

Publisher Copyright:
© 1994 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.

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