Leakage power and circuit aging cooptimization by gate replacement techniques

Keyphrases

• Circuit Aging 100%
• Leakage Power 100%
• Replacement Method 100%
• Co-optimization 100%
• Gate Replacement 100%
• Negative Bias Temperature Instability 87%
• Replacement Algorithm 75%
• Vector Control 37%
• Divide-and-conquer 37%
• Input Vector 37%
• Input Vector Control 37%
• Instability Mitigation 25%
• Induced Degradation 25%
• Aging Effect 12%
• Standby Leakage Power 12%
• Area Overhead 12%
• Leakage Reduction 12%
• Optimal Input 12%
• Benchmark Circuits 12%
• Circuit Degradation 12%
• Vector Selection 12%
• Leakage Power Reduction 12%

Computer Science

• Benchmark Circuit 100%
• Reliability Concern 100%
• Experimental Result 100%

Engineering

• Negative bias temperature instability 100%
• Input Vector 71%
• Induced Degradation 28%
• Experimental Result 14%
• Aging Effect 14%
• Area Overhead 14%