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Leakage power analysis and reduction for nano-scale circuits
Amit Agarwal
, Saibal Mukhopadhyay
,
Chris H. Kim
, Arijit Raychowdhury
, Kaushik Roy
Electrical and Computer Engineering
Research output
:
Chapter in Book/Report/Conference proceeding
›
Chapter
2
Scopus citations
Overview
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Keyphrases
Threshold Voltage
100%
Exponential Increase
100%
Nanoscale Regime
100%
Subthreshold Leakage Current
100%
Leakage Power Analysis
100%
Nanoscale Circuits
100%
Leakage Power Reduction
100%
On-state Current
100%
High Performance
50%
Resis
50%
Transistor
50%
Negative Impact
50%
Major Components
50%
Semiconductor Devices
50%
Leakage Current
50%
Supply Voltage
50%
Oxide Thickness
50%
Design Trade-offs
50%
Leakage Reduction Techniques
50%
Leakage Energy
50%
Technology Generation
50%
High Doping
50%
Total Energy Consumption
50%
Short Channel Effects
50%
High Integration
50%
Integration Density
50%
Circuit Level Techniques
50%
Energy Trade-off
50%
Thickness Scaling
50%
Non-metal Doping
50%
Engineering
Nanometre
100%
Nanoscale
100%
Major Component
50%
Electric Power Utilization
50%
Negative Impact
50%
Generation Technology
50%
Semiconductor Device
50%
Current Ratio
50%
Future Design
50%
Reduce Leakage
50%
High Integration Density
50%
Oxide Thickness
50%
Supply Voltage
50%
Material Science
Electronic Circuit
100%
Density
50%
Transistor
50%
Semiconductor Device
50%
Oxide Compound
50%