Layer Dependence of Dielectric Response and Water-Enhanced Ambient Degradation of Highly Anisotropic Black As

Hwanhui Yun; Supriya Ghosh; Prafful Golani; Steven J. Koester; K. Andre Mkhoyan

doi:10.1021/acsnano.0c01506

Layer Dependence of Dielectric Response and Water-Enhanced Ambient Degradation of Highly Anisotropic Black As

Hwanhui Yun, Supriya Ghosh, Prafful Golani, Steven J. Koester, K. Andre Mkhoyan

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Black arsenic (BAs) is a van der Waals layered material with a puckered honeycomb structure and has received increased interest due to its anisotropic properties and promising performance in devices. Here, crystalline structure, thickness-dependent dielectric responses, and ambient stability of BAs nanosheets are investigated using scanning transmission electron microscopy (STEM) imaging and spectroscopy. Atomic-resolution high-angle annular dark-field (HAADF)-STEM images directly visualize the three-dimensional structure and evaluate the degree of anisotropy. STEM-electron energy loss spectroscopy is used to measure the dielectric response of BAs as a function of the number of layers. Finally, BAs degradation under different ambient environments is studied, highlighting high sensitivity to moisture in the air.

Original language	English (US)
Pages (from-to)	5988-5997
Number of pages	10
Journal	ACS nano
Volume	14
Issue number	5
DOIs	https://doi.org/10.1021/acsnano.0c01506
State	Published - May 26 2020

Bibliographical note

Funding Information:
This project was partially supported by UMN MRSEC program DMR-1420013 and SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by NIST. Parts of this work was carried out in the College of Science and Engineering Characterization Facility, University of Minnesota (UMN), supported in part by the NSF through the UMN MRSEC program (No. DMR-1420013). P.G. and S.J.K. were supported by the NSF under Award No. ECCS-1708769. The authors also thank Sagar Udyavara and Prof. Matthew Neurock for insightful discussions.

Publisher Copyright:
Copyright © 2020 American Chemical Society.

Keywords

2D materials
EELS
HAADF-STEM
black arsenic
degradation
surface plasmon
thickness-dependent EELS

MRSEC Support

Partial

PubMed: MeSH publication types

Journal Article

Publisher link

10.1021/acsnano.0c01506

https://pubs.acs.org/doi/10.1021/acsnano.0c01506

Find It

Find It at U of M Libraries

Cite this

@article{f965885bbdff470a866894a59aa9e90f,

title = "Layer Dependence of Dielectric Response and Water-Enhanced Ambient Degradation of Highly Anisotropic Black As",

abstract = "Black arsenic (BAs) is a van der Waals layered material with a puckered honeycomb structure and has received increased interest due to its anisotropic properties and promising performance in devices. Here, crystalline structure, thickness-dependent dielectric responses, and ambient stability of BAs nanosheets are investigated using scanning transmission electron microscopy (STEM) imaging and spectroscopy. Atomic-resolution high-angle annular dark-field (HAADF)-STEM images directly visualize the three-dimensional structure and evaluate the degree of anisotropy. STEM-electron energy loss spectroscopy is used to measure the dielectric response of BAs as a function of the number of layers. Finally, BAs degradation under different ambient environments is studied, highlighting high sensitivity to moisture in the air.",

keywords = "2D materials, EELS, HAADF-STEM, black arsenic, degradation, surface plasmon, thickness-dependent EELS",

author = "Hwanhui Yun and Supriya Ghosh and Prafful Golani and Koester, {Steven J.} and Mkhoyan, {K. Andre}",

note = "Funding Information: This project was partially supported by UMN MRSEC program DMR-1420013 and SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by NIST. Parts of this work was carried out in the College of Science and Engineering Characterization Facility, University of Minnesota (UMN), supported in part by the NSF through the UMN MRSEC program (No. DMR-1420013). P.G. and S.J.K. were supported by the NSF under Award No. ECCS-1708769. The authors also thank Sagar Udyavara and Prof. Matthew Neurock for insightful discussions. Publisher Copyright: Copyright {\textcopyright} 2020 American Chemical Society.",

year = "2020",

month = may,

day = "26",

doi = "10.1021/acsnano.0c01506",

language = "English (US)",

volume = "14",

pages = "5988--5997",

journal = "ACS nano",

issn = "1936-0851",

publisher = "American Chemical Society",

number = "5",

}

TY - JOUR

T1 - Layer Dependence of Dielectric Response and Water-Enhanced Ambient Degradation of Highly Anisotropic Black As

AU - Yun, Hwanhui

AU - Ghosh, Supriya

AU - Golani, Prafful

AU - Koester, Steven J.

AU - Mkhoyan, K. Andre

N1 - Funding Information: This project was partially supported by UMN MRSEC program DMR-1420013 and SMART, one of seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by NIST. Parts of this work was carried out in the College of Science and Engineering Characterization Facility, University of Minnesota (UMN), supported in part by the NSF through the UMN MRSEC program (No. DMR-1420013). P.G. and S.J.K. were supported by the NSF under Award No. ECCS-1708769. The authors also thank Sagar Udyavara and Prof. Matthew Neurock for insightful discussions. Publisher Copyright: Copyright © 2020 American Chemical Society.

PY - 2020/5/26

Y1 - 2020/5/26

N2 - Black arsenic (BAs) is a van der Waals layered material with a puckered honeycomb structure and has received increased interest due to its anisotropic properties and promising performance in devices. Here, crystalline structure, thickness-dependent dielectric responses, and ambient stability of BAs nanosheets are investigated using scanning transmission electron microscopy (STEM) imaging and spectroscopy. Atomic-resolution high-angle annular dark-field (HAADF)-STEM images directly visualize the three-dimensional structure and evaluate the degree of anisotropy. STEM-electron energy loss spectroscopy is used to measure the dielectric response of BAs as a function of the number of layers. Finally, BAs degradation under different ambient environments is studied, highlighting high sensitivity to moisture in the air.

AB - Black arsenic (BAs) is a van der Waals layered material with a puckered honeycomb structure and has received increased interest due to its anisotropic properties and promising performance in devices. Here, crystalline structure, thickness-dependent dielectric responses, and ambient stability of BAs nanosheets are investigated using scanning transmission electron microscopy (STEM) imaging and spectroscopy. Atomic-resolution high-angle annular dark-field (HAADF)-STEM images directly visualize the three-dimensional structure and evaluate the degree of anisotropy. STEM-electron energy loss spectroscopy is used to measure the dielectric response of BAs as a function of the number of layers. Finally, BAs degradation under different ambient environments is studied, highlighting high sensitivity to moisture in the air.

KW - 2D materials

KW - EELS

KW - HAADF-STEM

KW - black arsenic

KW - degradation

KW - surface plasmon

KW - thickness-dependent EELS

UR - http://www.scopus.com/inward/record.url?scp=85085533032&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85085533032&partnerID=8YFLogxK

U2 - 10.1021/acsnano.0c01506

DO - 10.1021/acsnano.0c01506

M3 - Article

C2 - 32310631

SN - 1936-0851

VL - 14

SP - 5988

EP - 5997

JO - ACS nano

JF - ACS nano

IS - 5

ER -

Layer Dependence of Dielectric Response and Water-Enhanced Ambient Degradation of Highly Anisotropic Black As

Abstract

Bibliographical note

Keywords

MRSEC Support

PubMed: MeSH publication types

Publisher link

Find It

Other files and links

Fingerprint

MRSEC IRG-1: Electrostatic Control of Materials

MRSEC IRG-2: Sustainable Nanocrystal Materials

University of Minnesota MRSEC (DMR-1420013)

Cite this

Layer Dependence of Dielectric Response and Water-Enhanced Ambient Degradation of Highly Anisotropic Black As

Abstract

Bibliographical note

Keywords

MRSEC Support

PubMed: MeSH publication types

Publisher link

Find It

Other files and links

Fingerprint

Projects

MRSEC IRG-1: Electrostatic Control of Materials

MRSEC IRG-2: Sustainable Nanocrystal Materials

University of Minnesota MRSEC (DMR-1420013)

Cite this