Abstract
E-textiles that enable distribution of electronic components have advantages for wearable technology, in that functionality, power, and networking can be spread over a much larger area while preserving hand-feel and wearability. However, textile-embedded circuitry often must be machine-washable to conform to user expectations for care and maintenance, particularly for garments. In this study, we evaluate the robustness to home laundering of a previously-developed cut-and-sew technique for assembling e-textile circuits. Alternative surface insulation materials, textile substrate properties, and soldered component joints are evaluated. After around 1000 minutes (16.67 hours) of rigorous washing and drying, we measured a best-case 0% failure rate for component solder joints, and a best-case 0.38 ohm/m maximum increase in trace resistance. Liquid silicone seam sealer was effective in protecting 100% of solder joints. Two tape-type alternative surface insulation materials were effective in protecting bare traces and component attachment points respectively. Overall, results demonstrate the feasibility of producing insulated, washable cut-and-sew circuits for smart garment manufacturing.
Original language | English (US) |
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Title of host publication | ISWC 2018 - Proceedings of the 2018 ACM International Symposium on Wearable Computers |
Publisher | Association for Computing Machinery |
Pages | 104-111 |
Number of pages | 8 |
ISBN (Electronic) | 9781450359672 |
DOIs | |
State | Published - Oct 8 2018 |
Event | 22nd International Symposium on Wearable Computers, ISWC 2018 - Singapore, Singapore Duration: Oct 8 2018 → Oct 12 2018 |
Publication series
Name | Proceedings - International Symposium on Wearable Computers, ISWC |
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ISSN (Print) | 1550-4816 |
Conference
Conference | 22nd International Symposium on Wearable Computers, ISWC 2018 |
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Country/Territory | Singapore |
City | Singapore |
Period | 10/8/18 → 10/12/18 |
Bibliographical note
Publisher Copyright:Copyright © 2018 ACM.
Keywords
- Durability.
- E-textiles
- Embedded electronics
- Encapsulation
- Launderability
- Wearable technology