Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films

C. J. Sun; G. M. Chow; J. P. Wang; E. W. Soo; J. H. Je

doi:10.1063/1.1540133

Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films

C. J. Sun
, G. M. Chow
, J. P. Wang
, E. W. Soo
, J. H. Je

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.

Original language	English (US)
Pages (from-to)	8725-8727
Number of pages	3
Journal	Journal of Applied Physics
Volume	93
Issue number	10 3
DOIs	https://doi.org/10.1063/1.1540133
State	Published - May 15 2003

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10.1063/1.1540133

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title = "Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films",

abstract = "The correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.",

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AU - Sun, C. J.

AU - Chow, G. M.

AU - Wang, J. P.

AU - Soo, E. W.

AU - Je, J. H.

PY - 2003/5/15

Y1 - 2003/5/15

N2 - The correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.

AB - The correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10 3

ER -

Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films

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