Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films

C. J. Sun, G. M. Chow, J. P. Wang, E. W. Soo, J. H. Je

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.

Original languageEnglish (US)
Pages (from-to)8725-8727
Number of pages3
JournalJournal of Applied Physics
Volume93
Issue number10 3
DOIs
StatePublished - May 15 2003

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