Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure

C. J. Sun, G. M. Chow, S. W. Han, J. P. Wang, Y. K. Hwu, J. H. Je

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The phase miscibility of Co, Cr and Pt in oriented nanostructured CoCrPt magnetic thin films was investigated using anomalous x-ray scattering (AXS) from the (002) reflection and extended x-ray absorption fine structure (EXAFS) at Co K, Cr K and Pt LIII edges. The AXS measurements at Co K edge clearly showed the presence of Co in the crystalline region. However, Cr was not detected in the lattice. The EXAFS at Co K edge indicated that the nearest neighboring atoms of Co were mixed with 80% Co and 20% Pt, consistent with the results of EXAFS at Pt LIII edge. Our observations suggested that only Pt and Co were at the Co (002) lattice of the nanotextured CoCrPt thin films. This indicated that the AXS alone may not be reliable to determine the phase miscibility in textured thin films. Complementary information from the EXAFS was useful to understand the phase miscibility of nanoscale materials.

Original languageEnglish (US)
Article number122508
JournalApplied Physics Letters
Issue number12
StatePublished - Mar 20 2006

Bibliographical note

Funding Information:
G.M.C. thanks the support of this work by the NUS Academic Research Grant and the Office of Naval Research, USA. Work at Chonbuk National University was conducted under the auspices of the Korean MOST through PEFP User Program as a part of the 21C Frontier R&D Program and the Korean MOCIE through the New Technology R&D Program. The authors are also grateful to J. O. Cross for the help on the EXAFS data collection. The EXAFS data were collected at PNC-CAT at the Advanced Photon Source which facility was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. W-31-109-Eng-38, and 3C1 beamline of the Pohang Light Source partially supported by the MOST and POSCO.


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