Introduction

Ricardo Reis; Yu Cao; Gilson Wirth

doi:10.1007/978-1-4614-4078-9_1

Introduction

Ricardo Reis
, Yu Cao
, Gilson Wirth

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

The scaling of CMOS technology to the nanometer regime inevitability increases reliability concerns, profoundly impacting all aspects of circuit performance and posing a fundamental challenge to future IC design. These reliability concerns arise from many different sources, and become more severe with continuous scaling.

Original language	English (US)
Title of host publication	Circuit Design for Reliability
Publisher	Springer New York
Pages	1-4
Number of pages	4
ISBN (Electronic)	9781461440789
ISBN (Print)	9781461440772
DOIs	https://doi.org/10.1007/978-1-4614-4078-9_1
State	Published - Jan 1 2015
Externally published	Yes

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© Springer Science+Business Media New York 2015.

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10.1007/978-1-4614-4078-9_1

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Introduction

Abstract

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