Intrinsic variability in nano-CMOS design and beyond

Yu Cao, Chi Chao Wang, Yun Ye, Samatha Gummalla, Chaitali Chakrabarti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2010 IEEE International Electron Devices Meeting, IEDM 2010
Pages17.5.1
DOIs
StatePublished - 2010
Externally publishedYes
Event2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States
Duration: Dec 6 2010Dec 8 2010

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)0163-1918

Other

Other2010 IEEE International Electron Devices Meeting, IEDM 2010
Country/TerritoryUnited States
CitySan Francisco, CA
Period12/6/1012/8/10

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