Interlayer structures of the chiral smectic liquid crystal phases revealed by resonant x-ray scattering

L. S. Hirst, S. J. Watson, H. F. Gleeson, P. Cluzeau, P. Barois, R. Pindak, J. Pitney, A. Cady, P. M. Johnson, C. C. Huang, A. M. Levelut, G. Srajer, J. Pollmann, W. Caliebe, A. Seed, M. R. Herbert, J. W. Goodby, M. Hird

Research output: Contribution to journalArticlepeer-review

100 Scopus citations


The structures of the liquid crystalline chiral subphases exhibited by several materials containing either a selenium or sulphur atom have been investigated using a resonant x-ray scattering technique. This technique provides a unique structural probe for the ferroelectric, ferrielectric, antiferroelectric, and Sm[formula presented] phases. An analysis of the scattering features allows the structural models of the different subphases to be distinguished, in addition to providing a measurement of the helical pitch. This paper reports resonant scattering features in the antiferroelectric hexatic phase, the three- and four-layer intermediate phases, the antiferroelectric and ferroelectric phases and the Sm[formula presented] phase. The helicoidal pitch has been measured from the scattering peaks in the four-layer intermediate phase as well as in the antiferroelectric and ferroelectric phases. In the Sm[formula presented] phase, an investigation into the helical structure has revealed a pitch ranging from 5 to 54 layers in different materials. Further, a strong resonant scattering signal has been observed in mixtures of a selenium containing material with as much as 90% nonresonant material.

Original languageEnglish (US)
Pages (from-to)10
Number of pages1
JournalPhysical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
Issue number4
StatePublished - 2002


Dive into the research topics of 'Interlayer structures of the chiral smectic liquid crystal phases revealed by resonant x-ray scattering'. Together they form a unique fingerprint.

Cite this