Keyphrases
Interfacial Structure
100%
Dianhydride
100%
Silicon Dioxide
100%
Sum-frequency Generation Spectroscopy
33%
Second-order Susceptibility
33%
Silica
16%
Semiconductors
16%
Molecular Structure
16%
Atomic Force Microscopy
16%
Field-effect Transistors
16%
Silicon Wafer
16%
Film Thickness
16%
Polarization Combination
16%
Charge Transfer
16%
Native Oxide Layer
16%
Stretching Mode
16%
Surface Normal
16%
Buried Interface
16%
Bulk Crystal
16%
Air Interface
16%
Interphase Layer
16%
Global Fitting
16%
Herringbone Structure
16%
Face-on Structure
16%
Engineering
Frequency Generation
100%
Silicon Dioxide
100%
Atomic Force Microscopy
50%
Field-Effect Transistor
50%
Oxide Layer
50%
Bulk Crystal
50%
Air Interface
50%
Thin Films
50%
Silicon Wafer
50%
Material Science
Silicon Dioxide
100%
Film Thickness
50%
Field Effect Transistors
50%
Silicon Wafer
50%
Atomic Force Microscopy
50%
Surface (Surface Science)
50%
Oxide Compound
50%
Thin Films
50%
Molecular Structure
50%
Chemical Engineering
Film
100%
Silicon Dioxide
100%