In this article, the result from the experiment shows that BSIT's turn-off time increases remarkably with the temperature rising. On the basis of BSIT's operational mechanism, the turn-off process is discussed and divided into two parts, the two dimension process and the one dimension process, corresponding to saving time and falling time. The equation about turn-off time is induced and analyzed. According to this analysis, the influence of temperature on BSIT's turn-off time can be estimated and the result accords with experiment very well.
|Original language||English (US)|
|Number of pages||4|
|State||Published - Dec 1 1998|
|Event||Proceedings of the 1998 5th International Conference on Solid-State and Integrated Circuit Technology - Beijing, China|
Duration: Oct 21 1998 → Oct 23 1998
|Other||Proceedings of the 1998 5th International Conference on Solid-State and Integrated Circuit Technology|
|Period||10/21/98 → 10/23/98|