Indentation of silicate-glass films on Al2O3 substrates

Andrey V. Zagrebelny, Erica T. Lilleodden, William W Gerberich, C. Barry Carter

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


The deformation of thin layers of glass on crystalline materials has been examined using newly developed experimental methods for nanomechanical testing. Continuous films of anorthite (CaAl2Si2O8) were deposited onto Al2O3 surfaces by pulsed-laser deposition. Mechanical properties such as Young's modulus and hardness were probed with a high-resolution depth-sensing indentation instrument. Nanomechanical testing, combined with AFM in situ imaging of the deformed regions, allowed force-displacement measurements and imaging of the same regions of the specimen before and immediately after indentation. This new technique eliminates any uncertainty in locating the indentation after unloading. Emphasis has been placed on examining how the Al2O3 substrate crystallographic orientation will affect mechanical composite response of silicate-glass film/Al2O3 system.

Original languageEnglish (US)
Pages (from-to)1803-1808
Number of pages6
JournalJournal of the American Ceramic Society
Issue number7
StatePublished - 1999


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