Keyphrases
Circuit Level
100%
Timing Analysis
100%
Injection Effect
100%
Hot Carrier Injection
100%
Aging
66%
Cellular Level
66%
Delayed Degradation
66%
Monte Carlo Simulation
33%
Transistor
33%
Temporal Trends
33%
Multi-mode
33%
Digital Circuits
33%
Scalable Methods
33%
Driving Model
33%
Variational
33%
Relative Impact
33%
CMOS Technology
33%
Process Variation
33%
Age Variation
33%
Nanometer Technology
33%
Temperature Study
33%
Bias Temperature Instability
33%
Benchmark Circuits
33%
Circuit Delay
33%
Composite Effect
33%
Probabilistic Method
33%
Energy-driven
33%
Logic Cell
33%
Hot Carrier Effect
33%
Signal Transition
33%
Fast Degradation
33%
Degradation Analysis
33%
SPICE Model
33%
Transistor Level
33%
Engineering
Nanometre
100%
Energy Engineering
100%
Digital Circuits
100%
Multimode
100%
Hot Carrier Injection
100%
Delay Circuits
100%
Carrier Effect
100%
Process Variation
100%
Probabilistic Method
100%
SPICE
100%
Computer Science
Monte Carlo Simulation
100%
Digital Circuit
100%
Timing Analysis
100%
Scalable Method
100%
Process Variation
100%
Benchmark Circuit
100%
Relative Impact
100%
Transition Signal
100%
Probabilistic Method
100%
Material Science
Electronic Circuit
100%
Hot Carrier Injection
100%
Transistor
28%
Hot Carrier
14%