In vitro assessment of long-term reliability of low-cost μηCoG arrays

Kay Palopoli-Trojani, Virginia Woods, Chia Han Chiang, Michael Trumpis, Jonathan Viventi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Micro-electrocorticographic (μηΟΟ) electrode arrays provide a minimally invasive, high-resolution neural interface with broad cortical coverage. Previously, we fabricated μηCoG arrays at a lower cost than commercially available devices using low-cost industrial processes [1], [2]. Here, we report the in vitro electrical performance of five μηCoG designs undergoing an accelerated aging protocol. The impedance and yield of the μηCoG arrays were tracked over time. The equivalent lifetime at 37°C depended on the manufacturer and material stack-up, and ranged between 30 and greater than 760 days (ongoing). The main failure modes of these devices were delamination at the site of the electrode contact and broken traces due to metal dissolution. Based on these in vitro results, we offer several recommendations for μηCoG designs suitable for chronic implantation.

Original languageEnglish (US)
Title of host publication2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4503-4506
Number of pages4
ISBN (Electronic)9781457702204
DOIs
StatePublished - Oct 13 2016
Externally publishedYes
Event38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016 - Orlando, United States
Duration: Aug 16 2016Aug 20 2016

Publication series

NameProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
Volume2016-October
ISSN (Print)1557-170X

Other

Other38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2016
Country/TerritoryUnited States
CityOrlando
Period8/16/168/20/16

Bibliographical note

Funding Information:
Research supported by Army Research Office (ARO W911NF-14-1-0173) and National Science Foundation (NSF CCF-1422914).

Publisher Copyright:
© 2016 IEEE.

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