In Situ TEM Study and Control of Octahedral Units’ Migration in Rutile TiO2

Silu Guo; Supriya Ghosh; Sreejith Nair; Bharat Jalan; K. Andre Mkhoyan

doi:10.1093/mam/ozae044.799

In Situ TEM Study and Control of Octahedral Units’ Migration in Rutile TiO₂

Silu Guo, Supriya Ghosh, Sreejith Nair, Bharat Jalan, K. Andre Mkhoyan

Chemical Engineering and Materials Science

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1619-1620
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.799
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

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10.1093/mam/ozae044.799

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@article{16d5b46cbdf34caa98e98e84ae3c6b35,

title = "In Situ TEM Study and Control of Octahedral Units{\textquoteright} Migration in Rutile TiO2",

author = "Silu Guo and Supriya Ghosh and Sreejith Nair and Bharat Jalan and Mkhoyan, {K. Andre}",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.799",

language = "English (US)",

volume = "30",

pages = "1619--1620",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - In Situ TEM Study and Control of Octahedral Units’ Migration in Rutile TiO2

AU - Guo, Silu

AU - Ghosh, Supriya

AU - Nair, Sreejith

AU - Jalan, Bharat

AU - Mkhoyan, K. Andre

PY - 2024/7/24

Y1 - 2024/7/24

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UR - http://www.scopus.com/inward/citedby.url?scp=85215676992&partnerID=8YFLogxK

U2 - 10.1093/mam/ozae044.799

DO - 10.1093/mam/ozae044.799

M3 - Conference article

AN - SCOPUS:85215676992

SN - 1431-9276

VL - 30

SP - 1619

EP - 1620

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

In Situ TEM Study and Control of Octahedral Units’ Migration in Rutile TiO2

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In Situ TEM Study and Control of Octahedral Units’ Migration in Rutile TiO₂