Abstract
In situ construction of Co/SiO2/Co magnetic tunnel junctions using direct-write electron-beam-induced deposition is described. Proof-of-concept devices were built layer by layer depositing the specific components one at a time, allowing device manufacture using a strictly additive process. The devices exhibit a magnetic tunneling signature which agrees qualitatively with the Slonczewski model of magnetic tunneling.
Original language | English (US) |
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Article number | 222401 |
Journal | Applied Physics Letters |
Volume | 104 |
Issue number | 22 |
DOIs | |
State | Published - Jun 2 2014 |