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In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

  • M. L. Jablonski
  • , C. R. Winkler
  • , A. R. Damodaran
  • , J. Karthik
  • , J. G. Wen
  • , D. J. Miller
  • , L. W. Martin
  • , M. L. Taheri

Research output: Contribution to journal › Article › peer-review

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