@article{4aadd02feb2f4ddfa39b439d5b626225,
title = "In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films",
author = "Jablonski, \{M. L.\} and Winkler, \{C. R.\} and Damodaran, \{A. R.\} and J. Karthik and Wen, \{J. G.\} and Miller, \{D. J.\} and Martin, \{L. W.\} and Taheri, \{M. L.\}",
year = "2012",
month = jul,
doi = "10.1017/S1431927612009166",
language = "English (US)",
volume = "18",
pages = "1462--1463",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Oxford University Press",
number = "S2",
}