In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

M. L. Jablonski, C. R. Winkler, A. R. Damodaran, J. Karthik, J. G. Wen, D. J. Miller, L. W. Martin, M. L. Taheri

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1462-1463
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS2
StatePublished - Jul 2012
Externally publishedYes

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