In-operando measurements of photoluminescence to probe degradation and low-bias exciton-polaron quenching in OLEDs

Russell J. Holmes

doi:10.1002/sdtp.15075

In-operando measurements of photoluminescence to probe degradation and low-bias exciton-polaron quenching in OLEDs

Russell J. Holmes

Chemical Engineering and Materials Science

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	230
Number of pages	1
Journal	Digest of Technical Papers - SID International Symposium
Volume	52
Issue number	S2
DOIs	https://doi.org/10.1002/sdtp.15075
State	Published - 2021
Event	International Conference on Display Technology, ICDT 2021 - Beijing, China Duration: May 30 2021 → Jun 2 2021

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10.1002/sdtp.15075

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@article{7d650728a9b94d8c90c50eeb1d48255d,

title = "In-operando measurements of photoluminescence to probe degradation and low-bias exciton-polaron quenching in OLEDs",

author = "Holmes, \{Russell J.\}",

year = "2021",

doi = "10.1002/sdtp.15075",

language = "English (US)",

volume = "52",

pages = "230",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

publisher = "John Wiley and Sons Inc.",

number = "S2",

note = "International Conference on Display Technology, ICDT 2021 ; Conference date: 30-05-2021 Through 02-06-2021",

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TY - JOUR

T1 - In-operando measurements of photoluminescence to probe degradation and low-bias exciton-polaron quenching in OLEDs

AU - Holmes, Russell J.

PY - 2021

Y1 - 2021

UR - https://www.scopus.com/pages/publications/85115824371

UR - https://www.scopus.com/pages/publications/85115824371#tab=citedBy

U2 - 10.1002/sdtp.15075

DO - 10.1002/sdtp.15075

M3 - Conference article

AN - SCOPUS:85115824371

SN - 0097-966X

VL - 52

SP - 230

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - S2

T2 - International Conference on Display Technology, ICDT 2021

Y2 - 30 May 2021 through 2 June 2021

ER -

In-operando measurements of photoluminescence to probe degradation and low-bias exciton-polaron quenching in OLEDs

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