Improved spatial resolution in magnetic force microscopy

George D. Skidmore, E. Dan Dahlberg

Research output: Contribution to journalArticlepeer-review

67 Scopus citations


Electron beam deposited spikes for use in magnetic force microscopy have been grown onto atomic force microscope tips and coated with magnetic thin films using thermal evaporation. The resulting magnetically active regions are a close approximation to monopoles or dipoles located on the very end of the spikes. We show that these tips image with increased spatial resolution and less sample perturbation than the standard, commercially available tips.

Original languageEnglish (US)
Pages (from-to)3293-3295
Number of pages3
JournalApplied Physics Letters
Issue number22
StatePublished - Dec 1 1997


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