Impact of Uncertainty and Correlations on Mapping of Embedded Systems

Wenkai Guan; Milad Ghorbani Moghaddam; Cristinel Ababei

doi:10.1109/MWSCAS.2019.8884890

Impact of Uncertainty and Correlations on Mapping of Embedded Systems

Wenkai Guan, Milad Ghorbani Moghaddam, Cristinel Ababei

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

The impact of multiple levels of uncertainty in design parameters and uncertainty correlations on the quality of mapping solutions in embedded systems is investigated. The investigation is done with a simulation tool developed to conduct multi-objective design space exploration in order to generate robust Pareto frontiers in the solution space formed by reliability, execution time, and energy as design objectives. The simulation tool integrates proposed models for uncertainty and a hyper-volume based technique for quantifying the difference between Pareto frontiers. Simulations results show that by not considering uncertainty and correlations between different sources of uncertainty can lead to overestimation of the performance of the optimal solutions.

Original language	English (US)
Title of host publication	2019 IEEE 62nd International Midwest Symposium on Circuits and Systems, MWSCAS 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1077-1080
Number of pages	4
ISBN (Electronic)	9781728127880
DOIs	https://doi.org/10.1109/MWSCAS.2019.8884890
State	Published - Aug 2019
Externally published	Yes
Event	62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019 - Dallas, United States Duration: Aug 4 2019 → Aug 7 2019

Publication series

Name	Midwest Symposium on Circuits and Systems
Volume	2019-August
ISSN (Print)	1548-3746

Conference

Conference	62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019
Country/Territory	United States
City	Dallas
Period	8/4/19 → 8/7/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

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10.1109/MWSCAS.2019.8884890

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Guan, W., Moghaddam, M. G., & Ababei, C. (2019). Impact of Uncertainty and Correlations on Mapping of Embedded Systems. In 2019 IEEE 62nd International Midwest Symposium on Circuits and Systems, MWSCAS 2019 (pp. 1077-1080). Article 8884890 (Midwest Symposium on Circuits and Systems; Vol. 2019-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSCAS.2019.8884890

Impact of Uncertainty and Correlations on Mapping of Embedded Systems. / Guan, Wenkai; Moghaddam, Milad Ghorbani; Ababei, Cristinel.
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems, MWSCAS 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 1077-1080 8884890 (Midwest Symposium on Circuits and Systems; Vol. 2019-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Guan, W, Moghaddam, MG & Ababei, C 2019, Impact of Uncertainty and Correlations on Mapping of Embedded Systems. in 2019 IEEE 62nd International Midwest Symposium on Circuits and Systems, MWSCAS 2019., 8884890, Midwest Symposium on Circuits and Systems, vol. 2019-August, Institute of Electrical and Electronics Engineers Inc., pp. 1077-1080, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, United States, 8/4/19. https://doi.org/10.1109/MWSCAS.2019.8884890

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Impact of Uncertainty and Correlations on Mapping of Embedded Systems

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