Impact of low-dose electron irradiation on n+p silicon strip sensors

W. Adam, T. Bergauer, M. Dragicevic, M. Friedl, R. Fruehwirth, M. Hoch, J. Hrubec, M. Krammer, W. Treberspurg, W. Waltenberger, S. Alderweireldt, W. Beaumont, X. Janssen, S. Luyckx, P. Van Mechelen, N. Van Remortel, A. Van Spilbeeck, P. Barria, C. Caillol, B. ClerbauxG. De Lentdecker, D. Dobur, L. Favart, A. Grebenyuk, Th Lenzi, A. Léonard, Th Maerschalk, A. Mohammadi, L. Perniè, A. Randle-Conde, T. Reis, T. Seva, L. Thomas, C. Vander Velde, P. Vanlaer, J. Wang, F. Zenoni, S. Abu Zeid, F. Blekman, I. De Bruyn, J. D'Hondt, N. Daci, K. Deroover, N. Heracleous, J. Keaveney, S. Lowette, L. Moreels, A. Olbrechts, Q. Python, S. Tavernier, P. Van Mulders, G. Van Onsem, I. Van Parijs, D. A. Strom, S. Basegmez, G. Bruno, R. Castello, A. Caudron, L. Ceard, B. De Callatay, C. Delaere, T. Du Pree, L. Forthomme, A. Giammanco, J. Hollar, P. Jez, D. Michotte, C. Nuttens, L. Perrini, D. Pagano, L. Quertenmont, M. Selvaggi, M. Vidal Marono, N. Beliy, T. Caebergs, E. Daubie, G. H. Hammad, J. Härkönen, T. Lampén, P. R. Luukka, T. Mäenpää, T. Peltola, E. Tuominen, E. Tuovinen, P. Eerola, T. Tuuva, G. Beaulieu, G. Boudoul, C. Combaret, D. Contardo, G. Gallbit, N. Lumb, H. Mathez, L. Mirabito, S. Perries, D. Sabes, M. Vander Donckt, P. Verdier, S. Viret, Y. Zoccarato, J. L. Agram, E. Conte, J. Ch Fontaine, J. Andrea, D. Bloch, C. Bonnin, J. M. Brom, E. Chabert, L. Charles, Ch Goetzmann, L. Gross, J. Hosselet, C. Mathieu, M. Richer, K. Skovpen, C. Autermann, M. Edelhoff, H. Esser, L. Feld, W. Karpinski, K. Klein, M. Lipinski, A. Ostapchuk, G. Pierschel, M. Preuten, F. Raupach, J. Sammet, S. Schael, G. Schwering, B. Wittmer, M. Wlochal, V. Zhukov, C. Pistone, G. Fluegge, A. Kuensken, M. Geisler, O. Pooth, A. Stahl, N. Bartosik, J. Behr, A. Burgmeier, L. Calligaris, G. Dolinska, G. Eckerlin, D. Eckstein, T. Eichhorn, G. Fluke, J. Garay Garcia, A. Gizhko, K. Hansen, A. Harb, J. Hauk, A. Kalogeropoulos, C. Kleinwort, I. Korol, W. Lange, W. Lohmann, R. Mankel, H. Maser, G. Mittag, C. Muhl, A. Mussgiller, A. Nayak, E. Ntomari, H. Perrey, D. Pitzl, M. Schroeder, C. Seitz, S. Spannagel, A. Zuber, H. Biskop, V. Blobel, P. Buhmann, M. Centis-Vignali, A. R. Draeger, J. Erfle, E. Fretwurst, E. Garutti, J. Haller, Ch Henkel, M. Hoffmann, A. Junkes, R. Klanner, T. Lapsien, S. Mättig, M. Matysek, A. Perieanu, J. Poehlsen, T. Poehlsen, Ch Scharf, P. Schleper, A. Schmidt, S. Schuwalow, J. Schwandt, V. Sola, G. Steinbrück, B. Vormwald, J. Wellhausen, T. Barvich, Ch Barth, F. Boegelspacher, W. De Boer, E. Butz, M. Casele, F. Colombo, A. Dierlamm, R. Eber, B. Freund, F. Hartmann, Th Hauth, S. Heindl, K. H. Hoffmann, U. Husemann, A. Kornmeyer, S. Mallows, Th Muller, A. Nuernberg, M. Printz, H. J. Simonis, P. Steck, M. Weber, Th Weiler, A. Bhardwaj, A. Kumar, A. Kumar, K. Ranjan, H. Bakhshiansohl, H. Behnamian, M. Khakzad, M. Naseri, P. Cariola, G. De Robertis, L. Fiore, M. Franco, F. Loddo, G. Sala, L. Silvestris, D. Creanza, M. De Palma, G. Maggi, S. My, G. Selvaggi, S. Albergo, G. Cappello, M. Chiorboli, S. Costa, F. Giordano, A. Di Mattia, R. Potenza, M. A. Saizu, A. Tricomi, C. Tuvè, G. Barbagli, M. Brianzi, R. Ciaranfi, C. Civinini, E. Gallo, M. Meschini, S. Paoletti, G. Sguazzoni, V. Ciulli, R. D'Alessandro, S. Gonzi, V. Gori, E. Focardi, P. Lenzi, E. Scarlini, A. Tropiano, L. Viliani, F. Ferro, E. Robutti, M. Lo Vetere, S. Gennai, S. Malvezzi, D. Menasce, L. Moroni, D. Pedrini, M. Dinardo, S. Fiorendi, R. A. Manzoni, P. Azzi, N. Bacchetta, D. Bisello, M. Dall'Osso, T. Dorigo, P. Giubilato, N. Pozzobon, M. Tosi, A. Zucchetta, F. De Canio, L. Gaioni, M. Manghisoni, B. Nodari, V. Re, G. Traversi, D. Comotti, L. Ratti, G. M. Bilei, L. Bissi, B. Checcucci, D. Magalotti, M. Menichelli, A. Saha, L. Servoli, L. Storchi, M. Biasini, E. Conti, D. Ciangottini, L. Fanò, P. Lariccia, G. Mantovani, D. Passeri, P. Placidi, M. Salvatore, A. Santocchia, L. A. Solestizi, A. Spiezia, N. Demaria, A. Rivetti, R. Bellan, S. Casasso, M. Costa, R. Covarelli, E. Migliore, E. Monteil, M. Musich, L. Pacher, F. Ravera, A. Romero, A. Solano, P. Trapani, R. Jaramillo Echeverria, M. Fernandez, G. Gomez, D. Moya, F. J. Gonzalez Sanchez, F. J. Munoz Sanchez, I. Vila, A. L. Virto, D. Abbaneo, I. Ahmed, E. Albert, G. Auzinger, G. Berruti, G. Bianchi, G. Blanchot, H. Breuker, D. Ceresa, J. Christiansen, K. Cichy, J. Daguin, M. D'Alfonso, A. D'Auria, S. Detraz, S. De Visscher, D. Deyrail, F. Faccio, D. Felici, N. Frank, K. Gill, D. Giordano, P. Harris, A. Honma, J. Kaplon, A. Kornmayer, M. Kortelainen, L. Kottelat, M. Kovacs, M. Mannelli, A. Marchioro, S. Marconi, S. Martina, S. Mersi, S. Michelis, M. Moll, A. Onnela, T. Pakulski, S. Pavis, A. Peisert, J. F. Pernot, P. Petagna, G. Petrucciani, H. Postema, P. Rose, M. Rzonca, M. Stoye, P. Tropea, J. Troska, A. Tsirou, F. Vasey, P. Vichoudis, B. Verlaat, L. Zwalinski, F. Bachmair, R. Becker, L. Bäni, D. Di Calafiori, B. Casal, L. Djambazov, M. Donega, M. Dünser, P. Eller, C. Grab, D. Hits, U. Horisberger, J. Hoss, G. Kasieczka, W. Lustermann, B. Mangano, M. Marionneau, P. Martinez Ruiz Del Arbol, M. Masciovecchio, L. Perrozzi, U. Roeser, M. Rossini, A. Starodumov, M. Takahashi, R. Wallny, C. Amsler, K. Bösiger, L. Caminada, F. Canelli, V. Chiochia, A. De Cosa, C. Galloni, T. Hreus, B. Kilminster, C. Lange, R. Maier, J. Ngadiuba, D. Pinna, P. Robmann, S. Taroni, Y. Yang, W. Bertl, K. Deiters, W. Erdmann, R. Horisberger, H. C. Kaestli, D. Kotlinski, U. Langenegger, B. Meier, T. Rohe, S. Streuli, P. H. Chen, C. Dietz, U. Grundler, W. S. Hou, R. S. Lu, M. Moya, R. Wilken, D. Cussans, H. Flacher, J. Goldstein, M. Grimes, J. Jacob, S. Seif El Nasr-Storey, J. Cole, P. Hobson, D. Leggat, I. D. Reid, L. Teodorescu, R. Bainbridge, P. Dauncey, J. Fulcher, G. Hall, A. M. Magnan, M. Pesaresi, D. M. Raymond, K. Uchida, J. A. Coughlan, K. Harder, J. Ilic, I. R. Tomalin, A. Garabedian, U. Heintz, M. Narain, J. Nelson, S. Sagir, T. Speer, J. Swanson, D. Tersegno, J. Watson-Daniels, M. Chertok, J. Conway, R. Conway, C. Flores, R. Lander, D. Pellett, F. Squires, J. Thomson, R. Yohay, K. Burt, J. Ellison, G. Hanson, M. Malberti, M. Olmedo, G. Cerati, V. Sharma, A. Vartak, A. Yagil, G. Zevi Della Porta, V. Dutta, L. Gouskos, J. Incandela, S. Kyre, N. McColl, S. Mullin, D. White, J. P. Cumalat, W. T. Ford, A. Gaz, M. Krohn, K. Stenson, S. R. Wagner, B. Baldin, G. Bolla, K. Burkett, J. Butler, H. Cheung, J. Chramowicz, D. Christian, W. E. Cooper, G. Deptuch, G. Derylo, C. Gingu, S. Gruenendahl, S. Hasegawa, J. Hoff, J. Howell, M. Hrycyk, S. Jindariani, M. Johnson, A. Jung, U. Joshi, F. Kahlid, M. Lei, R. Lipton, T. Liu, S. Los, M. Matulik, P. Merkel, S. Nahn, A. Prosser, R. Rivera, A. Shenai, L. Spiegel, N. Tran, L. Uplegger, E. Voirin, H. Yin, M. R. Adams, D. R. Berry, A. Evdokimov, O. Evdokimov, C. E. Gerber, D. J. Hofman, B. K. Kapustka, C. O'Brien, D. I. Sandoval Gonzalez, H. Trauger, P. Turner, N. Parashar, J. Stupak, C. Iii, D. Bortoletto, M. Bubna, N. Hinton, M. Jones, D. H. Miller, X. Shi, P. Tan, P. Baringer, A. Bean, G. Benelli, J. Gray, D. Majumder, D. Noonan, S. Sanders, R. Stringer, A. Ivanov, M. Makouski, N. Skhirtladze, R. Taylor, I. Anderson, D. Fehling, A. Gritsan, P. Maksimovic, C. Martin, K. Nash, M. Osherson, M. Swartz, M. Xiao, J. G. Acosta, L. M. Cremaldi, S. Oliveros, L. Perera, D. Summers, K. Bloom, S. Bose, D. R. Claes, A. Dominguez, C. Fangmeier, R. Gonzalez Suarez, F. Meier, J. Monroy, K. Hahn, S. Sevova, K. Sung, M. Trovato, E. Bartz, D. Duggan, E. Halkiadakis, A. Lath, M. Park, S. Schnetzer, R. Stone, M. Walker, S. Malik, H. Mendez, J. E. Ramirez Vargas, M. Alyari, J. Dolen, J. George, A. Godshalk, I. Iashvili, J. Kaisen, A. Kharchilava, A. Kumar, S. Rappoccio, J. Alexander, J. Chaves, J. Chu, S. Dittmer, G. Kaufman, N. Mirman, A. Ryd, E. Salvati, L. Skinnari, J. Thom, J. Thompson, J. Tucker, L. Winstrom, B. Akgün, K. M. Ecklund, T. Nussbaum, J. Zabel, B. Betchart, R. Covarelli, R. Demina, O. Hindrichs, G. Petrillo, R. Eusebi, I. Osipenkov, A. Perloff, K. A. Ulmer, A. G. Delannoy, P. D'Angelo, W. Johns

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The response of n+p silicon strip sensors to electrons from a 90Sr source was measured using a multi-channel read-out system with 25 ns sampling time. The measurements were performed over a period of several weeks, during which the operating conditions were varied. The sensors were fabricated by Hamamatsu Photonics on 200 μm thick float-zone and magnetic-Czochralski silicon. Their pitch was 80 μm, and both p-stop and p-spray isolation of the n+ strips were studied. The electrons from the 90Sr source were collimated to a spot with a full-width-at-half-maximum of 2 mm at the sensor surface, and the dose rate in the SiO2 at the maximum was about 50 Gy(SiO2)/d. After only a few hours of making measurements, significant changes in charge collection and charge sharing were observed. Annealing studies, with temperatures up to 80 °C and annealing times of 18 h showed that the changes can only be partially annealed. The observations can be qualitatively explained by the increase of the positive oxide-charge density due to the ionization of the SiO2 by the radiation from the β source. TCAD simulations of the electric field in the sensor for different oxide-charge densities and different boundary conditions at the sensor surface support this explanation. The relevance of the measurements for the design of n+p strip sensors is discussed.

Original languageEnglish (US)
Pages (from-to)100-112
Number of pages13
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume803
DOIs
StatePublished - Dec 11 2015

Bibliographical note

Funding Information:
The research leading to these results has received funding from the European Commission under the FP7 Research Infrastructures project AIDA, grant agreement no. 262025. The information herein only reflects the views of its authors and not those of the European Commission and no warranty expressed or implied is made with regard to such information or its use.

Funding Information:
The authors thank W. Gärtner and the workshop of the Institute for Experimental Physics for designing and constructing the β setup, and P. Buhmann, R.-P. Feller, M. Matysek and R. Mohrmann for the continuous improvement and maintenance of the measurement infrastructure of the detector laboratory as well as for helping with the measurements. We are also grateful to the HGF Alliance Physics at the Terascale, which has partially funded the setup used for the measurements, and to the BMBF, the Ministry of Research and Education of the German Federal Republic, for funding the Ph.D. position of J. Erfle within the Forschungsschwerpunkt FSP-102, Elementarteilchenphysik mit dem CMS-Experiment.

Publisher Copyright:
© 2015 Elsevier B.V. All rights reserved.

Keywords

  • Charge collection
  • Radiation damage
  • Silicon strip sensors
  • Surface damage

Fingerprint Dive into the research topics of 'Impact of low-dose electron irradiation on n<sup>+</sup>p silicon strip sensors'. Together they form a unique fingerprint.

Cite this