Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope

Tathagata De, Antony M. Chettoor, Pranav Agarwal, Murti V. Salapaka, Saju Nettikadan

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The atomic force microscope (AFM) is widely used for studying the surface morphology and growth of live cells. There are relatively fewer reports on the AFM imaging of yeast cells [1] (Kasas and Ikai, 1995), [2] (Gad and Ikai, 1995). Yeasts have thick and mechanically strong cell walls and are therefore difficult to attach to a solid substrate. In this report, a new immobilization technique for the height mode imaging of living yeast cells in solid media using AFM is presented. The proposed technique allows the cell surface to be almost completely exposed to the environment and studied using AFM. Apart from the new immobilization protocol, for the first time, height mode imaging of live yeast cell surface in intermittent contact mode is presented in this report. Stable and reproducible imaging over a 10-h time span is observed. A significant improvement in operational stability will facilitate the investigation of growth patterns and surface patterns of yeast cells.

Original languageEnglish (US)
Pages (from-to)254-258
Number of pages5
JournalUltramicroscopy
Volume110
Issue number3
DOIs
StatePublished - Feb 1 2010

Keywords

  • Atomic force microscopy
  • Intermittent contact mode
  • Live cells
  • Yeast

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