Imaging of stacking faults in highly oriented pyrolytic graphite using scanning tunneling microscopy

S. R. Snyder, T. Foecke, H. S. White, W. W. Gerberich

Research output: Contribution to journalArticle

21 Scopus citations

Abstract

Scanning tunneling microscopy images of the (0001) plane of highly oriented pyrolytic graphite show defect regions consisting of an extensive network of partial dislocations that form extended and contracted nodes. The partial dislocations in hexagonal graphite enclose triangular regions (~1000 nm on a side) of faulted material comprised of rhombohedral graphite. Electronic and elastic interactions of the tip with the HOPG surface are proposed to explain the observed image contrast between hexagonal and rhombohedral graphite.

Original languageEnglish (US)
Pages (from-to)341-344
Number of pages4
JournalJournal of Materials Research
Volume7
Issue number2
DOIs
StatePublished - Feb 1992

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