Abstract
Scanning tunneling microscopy images of the (0001) plane of highly oriented pyrolytic graphite show defect regions consisting of an extensive network of partial dislocations that form extended and contracted nodes. The partial dislocations in hexagonal graphite enclose triangular regions (~1000 nm on a side) of faulted material comprised of rhombohedral graphite. Electronic and elastic interactions of the tip with the HOPG surface are proposed to explain the observed image contrast between hexagonal and rhombohedral graphite.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 341-344 |
| Number of pages | 4 |
| Journal | Journal of Materials Research |
| Volume | 7 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 1992 |
Bibliographical note
Funding Information:The authors thank Professor John H. Weaver and Dr. Kenneth McGreer for helpful discussions. This work was supported by the Office of Naval Research Young Investigator Program and by the Department of Energy, Basic Sciences Division, Grant DE-FG02-84ER45141. STM facilities were supported by the Center for Interfacial Engineering with funding from NSF Engineering Research Centers Program (CDR 8721551) and industrial sponsors.