Imaging Nanometer Scale Defects in Langmuir-Blodgett Films with the Atomic Force Microscope

H. G. Hansma, S. A.C. Gould, P. K. Hansma, H. E. Gaub, M. L. Longo, J. A.N. Zasadzinski

Research output: Contribution to journal › Article › peer-review

146 Scopus citations

Fingerprint

Dive into the research topics of 'Imaging Nanometer Scale Defects in Langmuir-Blodgett Films with the Atomic Force Microscope'. Together they form a unique fingerprint.

Material Science

Chemistry