IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware

  • Peiyu Liu
  • , Shouling Ji
  • , Xuhong Zhang
  • , Qinming Dai
  • , Kangjie Lu
  • , Lirong Fu
  • , Wenzhi Chen
  • , Peng Cheng
  • , Wenhai Wang
  • , Raheem Beyah

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

16 Scopus citations

Fingerprint

Dive into the research topics of 'IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware'. Together they form a unique fingerprint.

Keyphrases

Computer Science