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Identification of the misfit dislocations at an FeAl/AlAs/GaAs interface using moiré fringe contrast in a transmission electron microscope

  • J. E. Angelo
  • , J. N. Kuznia
  • , A. M. Wowchak
  • , P. I. Cohen
  • , W. W. Gerberich

Research output: Contribution to journal › Article › peer-review

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