Hot scanning tunneling microscope study of B type step edges and small silicon islands on Si(001)

Chris Pearson; Michael Krueger; Robert Curtis; Brian Borovsky; Xin Shi; Eric Ganz

doi:10.1116/1.579716

Hot scanning tunneling microscope study of B type step edges and small silicon islands on Si(001)

Chris Pearson, Michael Krueger, Robert Curtis, Brian Borovsky, Xin Shi, Eric Ganz

Physics and Astronomy (Twin Cities)

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

We have used a scanning tunneling microscope to image step edges as well as small Si islands on the Si(001)-2 X1 reconstructed surface at temperatures up to 700 K. We count the changes in the step edge configuration and extract activation energies for the dominant processes. We also observe fluctuations in Si island size at rates that are higher than those we observe on step edges. To aid visualization of the dynamics, we display consecutive images of fluctuating islands and step edges as movies.

Original language	English (US)
Pages (from-to)	1506-1510
Number of pages	5
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	13
Issue number	3
DOIs	https://doi.org/10.1116/1.579716
State	Published - May 1995

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abstract = "We have used a scanning tunneling microscope to image step edges as well as small Si islands on the Si(001)-2 X1 reconstructed surface at temperatures up to 700 K. We count the changes in the step edge configuration and extract activation energies for the dominant processes. We also observe fluctuations in Si island size at rates that are higher than those we observe on step edges. To aid visualization of the dynamics, we display consecutive images of fluctuating islands and step edges as movies.",

author = "Chris Pearson and Michael Krueger and Robert Curtis and Brian Borovsky and Xin Shi and Eric Ganz",

year = "1995",

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T1 - Hot scanning tunneling microscope study of B type step edges and small silicon islands on Si(001)

AU - Pearson, Chris

AU - Krueger, Michael

AU - Curtis, Robert

AU - Borovsky, Brian

AU - Shi, Xin

AU - Ganz, Eric

PY - 1995/5

Y1 - 1995/5

N2 - We have used a scanning tunneling microscope to image step edges as well as small Si islands on the Si(001)-2 X1 reconstructed surface at temperatures up to 700 K. We count the changes in the step edge configuration and extract activation energies for the dominant processes. We also observe fluctuations in Si island size at rates that are higher than those we observe on step edges. To aid visualization of the dynamics, we display consecutive images of fluctuating islands and step edges as movies.

AB - We have used a scanning tunneling microscope to image step edges as well as small Si islands on the Si(001)-2 X1 reconstructed surface at temperatures up to 700 K. We count the changes in the step edge configuration and extract activation energies for the dominant processes. We also observe fluctuations in Si island size at rates that are higher than those we observe on step edges. To aid visualization of the dynamics, we display consecutive images of fluctuating islands and step edges as movies.

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Hot scanning tunneling microscope study of B type step edges and small silicon islands on Si(001)

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