Hopping transport in doped co-deposited mixed-phase hydrogenated amorphous/nanocrystalline silicon thin films

L. R. Wienkes, C. Blackwell, J. Kakalios

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Studies of the electronic transport properties of n-type doped hydrogenated amorphous/nanocrystalline silicon (a/nc-Si:H) films deposited in a dual-plasma co-deposition reactor are described. For these doped a/nc-Si:H, the conductivity increases monotonically for increasing crystal fractions up to 60% and displays marked deviations from a simple thermally activated temperature dependence. Analysis of the temperature dependence of the activation energy for these films finds that the dark conductivity is best described by a power-law temperature dependence, σ= σ o (T/T o) n where n= 1-4, suggesting multiphonon hopping as the main transport mechanism. These results suggest that electronic transport in mixed-phase films occurs through the a-Si:H matrix at lower nanocrystal concentrations and shifts to hopping conduction between clusters of nanocrystals at higher nanocrystal densities.

Original languageEnglish (US)
Title of host publicationAmorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2011
Pages285-290
Number of pages6
DOIs
StatePublished - Jan 1 2012
Event2011 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 25 2011Apr 29 2011

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1321
ISSN (Print)0272-9172

Other

Other2011 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/25/114/29/11

Fingerprint Dive into the research topics of 'Hopping transport in doped co-deposited mixed-phase hydrogenated amorphous/nanocrystalline silicon thin films'. Together they form a unique fingerprint.

  • Cite this

    Wienkes, L. R., Blackwell, C., & Kakalios, J. (2012). Hopping transport in doped co-deposited mixed-phase hydrogenated amorphous/nanocrystalline silicon thin films. In Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2011 (pp. 285-290). (Materials Research Society Symposium Proceedings; Vol. 1321). https://doi.org/10.1557/opl.2011.809