Highly reliable dc SQUIDs in temperature with laser-MBE YBa2Cu3OX thin films

Jing Wang, Bing Han, Fan Chen, Tong Zhao, Fengzhi Xu, Yueliang Zhou, Genghua Chen, Huibin Lu, Qiansheng Yang, Tianhong Cui

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Highly reliable dc superconducting quantum interference devices (SQUIDs) in temperature with step edge junctions (SEJs) were fabricated with laser molecular beam epitaxy (L-MBE) YBa2Cu3OX thin films. The reflection high-energy electron diffraction oscillation cycles proved that the superconducting films were epitaxially grown on the atomic scale. In the dc SQUID temperature transition curves, the tail structures appear at a temperature close to the transition point. The critical current dependent temperature, IC ∼ (1 - T/TC)2, shows that the L-MBE SEJ behaves like an SNS type junction. The white noise level, 2.0 × 10-5Φ0/√Hz at 200 Hz, triangular wave signal, critical current and other characteristics exhibit no change after 42 temperature cycles and 108 days of storage.

Original languageEnglish (US)
Pages (from-to)431-434
Number of pages4
JournalSolid State Communications
Issue number8
StatePublished - May 2003

Bibliographical note

Funding Information:
This work was supported by the National Center for R&D on Superconductivity and the Ministry of Science and Technology of China (NKBRSF-G19990646).

Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.


  • A. YBCO
  • A. dc SQUID
  • B. MBE
  • D. Reliability


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