Abstract
In this work, deep neural networks (DNNs) are trained and used to model high-speed channels for signal integrity analysis. The DNN models predict eye-diagram metrics by taking advantage of the large amount of simulation results made available in a previous design or at an earlier design stage. The proposed DNN models characterize high-speed channels through extrapolation with saved coefficients, which requires no complex simulations and can be achieved in a highly efficient manner. It is demonstrated through numerical examples that the proposed DNN models achieve good accuracy in predicting eye-diagram metrics from input design parameters. In the DNN models, no assumptions are made on the distributions of and the interactions among individual design parameters.
Original language | English (US) |
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Title of host publication | 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1-3 |
Number of pages | 3 |
ISBN (Electronic) | 9781467364836 |
DOIs | |
State | Published - Jul 2 2017 |
Externally published | Yes |
Event | 26th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017 - San Jose, United States Duration: Oct 15 2017 → Oct 18 2017 |
Publication series
Name | 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017 |
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Volume | 2018-January |
Conference
Conference | 26th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2017 |
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Country/Territory | United States |
City | San Jose |
Period | 10/15/17 → 10/18/17 |
Bibliographical note
Publisher Copyright:© 2017 IEEE.