High resolution in-situ imaging of reactive heterogeneous surfaces

L. F. Garfias-Mesias, W. H. Smyrl

Research output: Contribution to journalConference article

9 Scopus citations

Abstract

A modified near-field optical microscope (NSOM) was used to locate reactive sites on polycrystalline titanium immersed in sulfuric acid. Photoelectrochemical imaging was carried out on the NSOM by using a new shear-force feedback method. PEM with simultaneous independent topography (using the tuning fork method) resolved submicron features at reactive sites at inclusions and grain boundaries. Both PEM and topographic images were obtained in-situ with high lateral resolution by using specially fabricated tips with 100 nm aperture.

Original languageEnglish (US)
Pages (from-to)3651-3657
Number of pages7
JournalElectrochimica Acta
Volume44
Issue number21
DOIs
StatePublished - Jun 1 1999
EventProceedings of the 1999 2nd International Symposium on Electrochemical Microsystems Technologies - Electrochemical Applications of Microtechnology - Grevenbroich, Ger
Duration: Sep 9 1999Sep 11 1999

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