High-resolution imaging of heterogeneous surfaces with multifunctional NSOM

J. Kerimo, M. Buechler, William H. Smyrl

Research output: Contribution to journalConference articlepeer-review

Abstract

Imaging of surfaces and structures by NSOM has matured and is routinely used for studies ranging from biology to materials science. In the present paper, new developments will be emphasized that have resulted from the incorporation of a new technique for shear force feedback control of the scanning tip. The new technique involves the use of a quartz crystal tuning fork with the microscope, and this provides an open architecture for scanning tips. Thus not only is the normal optical contrast imaging done concurrently with topography imaging with optical fibers, but now one may substitute other tips such as nanoelectrodes for electrochemical imaging of reactive surfaces in concurrence with in-situ topography imaging. The modified instrument is now a multifunctional microscope that has many diverse applicationss.

Original languageEnglish (US)
Article number102940F
Pages (from-to)232-256
Number of pages25
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume10294
DOIs
StatePublished - Jul 19 1999
EventOptical Metrology: A Critical Review 1999 - Denver, United States
Duration: Jul 18 1999Jul 23 1999

Bibliographical note

Funding Information:
This work has been supported by NSF/DMR-9816404, by the American

Funding Information:
Chemical Society - Petroleum Research Fund /PRF #33309 -ACS, and by Seagate

Keywords

  • SECM
  • electrochemistry
  • fluorescence
  • high resolution
  • in-situ NSOM
  • modulation
  • nanoelectrodes
  • photoelectrochemistry
  • review

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