Abstract
Imaging of surfaces and structures by NSOM has matured and is routinely used for studies ranging from biology to materials science. In the present paper, new developments will be emphasized that have resulted from the incorporation of a new technique for shear force feedback control of the scanning tip. The new technique involves the use of a quartz crystal tuning fork with the microscope, and this provides an open architecture for scanning tips. Thus not only is the normal optical contrast imaging done concurrently with topography imaging with optical fibers, but now one may substitute other tips such as nanoelectrodes for electrochemical imaging of reactive surfaces in concurrence with in-situ topography imaging. The modified instrument is now a multifunctional microscope that has many diverse applicationss.
| Original language | English (US) |
|---|---|
| Article number | 102940F |
| Pages (from-to) | 232-256 |
| Number of pages | 25 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 10294 |
| DOIs | |
| State | Published - Jul 19 1999 |
| Event | Optical Metrology: A Critical Review 1999 - Denver, United States Duration: Jul 18 1999 → Jul 23 1999 |
Bibliographical note
Funding Information:This work has been supported by NSF/DMR-9816404, by the American
Funding Information:
Chemical Society - Petroleum Research Fund /PRF #33309 -ACS, and by Seagate
Funding Information:
This work has been supported by NSF/DMR-9816404, by the American Chemical Society-Petroleum Research Fund/PRF #33309-ACS, and by Seagate Recording Heads.
Publisher Copyright:
© 2017 SPIE.
Keywords
- SECM
- electrochemistry
- fluorescence
- high resolution
- in-situ NSOM
- modulation
- nanoelectrodes
- photoelectrochemistry
- review