High-resolution field emission sem (FESEM) of bulk biological samples: relationship between different metal coatings, their thicknesses, and quality of backscatter electron (BSE) versus secondary-electron (SE) imaging

Chris Frethem, Carol Wells, Vince Carlino, Stanley L. Erlandsen

Research output: Contribution to journalConference articlepeer-review

Abstract

In the study, investigated is the relationship between the thickness of metal coatings produced by ion beam sputtering and the quality of imaging obtained by SE and BSE of biological samples. Imaging of surface topography by BSE was achieved at thinner metal coatings than by SE. The BSE imaging was relatively independent of local surface charging and likewise of contamination, due to higher energy of BSE.

Original languageEnglish (US)
Pages (from-to)460-461
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

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