High-resolution electron imaging of amorphous layers with aberration-corrected probes

S. Maccagnano-Zacher; A. Mkhoyan; J. Silcox

doi:10.1017/S1431927608088120

High-resolution electron imaging of amorphous layers with aberration-corrected probes

S. Maccagnano-Zacher, A. Mkhoyan, J. Silcox

Chemical Engineering and Materials Science

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	940-941
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608088120
State	Published - Aug 2008

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10.1017/S1431927608088120

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title = "High-resolution electron imaging of amorphous layers with aberration-corrected probes",

author = "S. Maccagnano-Zacher and A. Mkhoyan and J. Silcox",

year = "2008",

month = aug,

doi = "10.1017/S1431927608088120",

language = "English (US)",

volume = "14",

pages = "940--941",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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AU - Maccagnano-Zacher, S.

AU - Mkhoyan, A.

AU - Silcox, J.

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SP - 940

EP - 941

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

High-resolution electron imaging of amorphous layers with aberration-corrected probes

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