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HIGH RESOLUTION BACKPROJECTION IMAGING WITH A SCANNING LASER ACOUSTIC MICROSCOPE.
R. K. Mueller
,
W. P. Robbins
, Z. Q. Zhou
, E. Rudd
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Conference article
›
peer-review
Overview
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Keyphrases
High-resolution
100%
Scanning Laser
100%
Laser Acoustics
100%
Back-projection
100%
Acoustic Microscope
100%
Acoustics
50%
Well-defined
50%
Imaging Capability
50%
Shear Wave
50%
Glass Slide
50%
Lateral Dimension
50%
Compression Wave
50%
Electron Microscope
50%
Locator
50%
Acoustic Features
50%
Back Projection Imaging
50%
Glass Block
50%
Bottom Side
50%
Engineering
Acoustic Wavelength
100%
Glass Slide
100%
Compressional Wave
100%
Shear Wave
100%
Acoustic Feature
100%
Bottom Side
100%
High Resolution
100%
Physics
High Resolution
100%
Acoustic Microscope
100%
Electron Microscope
50%
S Wave
50%
Compressional Wave
50%
Earth and Planetary Sciences
Laser Scanning
100%